Semiconductor process and performance sensor

Abstract

Disclosed are techniques that can be used in a semiconductor chip to determine performance such as timing performance. Among other features, supply voltages and clock rates may be adjusted to accommodate the operating temperature and to compensate for the processing variations that occurred when that chip was produced, or may occur as the chip is used. The techniques include determining a series of variables that affect performance, determining the sensitivity of timing paths in the circuit to each variable, duplicating the most sensitive paths. A novel sensor circuit is produced that includes the sensitive paths, which can be used to determine when the chip is performing as required and when it is not, and adjusting one or more supply voltages and/or clock rates in a static or real time manner when the circuit is not performing as required.