The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2020
Filed:
Nov. 07, 2017
Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;
Taku Komorida, Fuchu, JP;
Atsushi Takami, Kawasaki, JP;
Masato Fukumori, Chofu, JP;
Haruhiko Ueno, Sagamihara, JP;
Tsuyoshi Hashimoto, Kawasaki, JP;
FUJITSU LIMITED, Kawasaki, JP;
Abstract
A start test method executed by a system including a calculation device and a management device that manages failure information on the calculation device, the start test method includes storing, by a first processor included in the management device, a failure rate that has been calculated for each of parts of the calculation device based on the failure information received from the calculation device as performance information, associating with time information and a part of the calculation device; obtaining a failure rate of each of the parts at a time of start of the calculation device based on the performance information and a time when the calculation device is to be started; notifying the calculation device of the obtained failure rate; and executing, by a second processor included in the calculation device, a start test of the calculation device in accordance with the notified failure rate.