The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2020

Filed:

Mar. 09, 2018
Applicant:

Toshiba Memory Corporation, Minato-ku, JP;

Inventors:

David Malcolm Symons, Kidlington, GB;

Paul Edward Hanham, Marlborough, GB;

Francesco Giorgio, Headington, GB;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); H03M 13/39 (2006.01); G11C 29/42 (2006.01); G11B 20/18 (2006.01); H03M 13/45 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1048 (2013.01); G11B 20/182 (2013.01); G11B 20/1876 (2013.01); G11C 29/42 (2013.01); H03M 13/39 (2013.01); H03M 13/45 (2013.01);
Abstract

A method for fast calculation of a frame error rate (FER) of an error correcting code (ECC) soft decoder using a soft read process includes determining an MI-FER conversion data structure based on a relationship between mutual information (MI) of input channels and output channels of a memory, and FER of the ECC soft decoder, and decoding an encoded data codeword stored in a memory page of the memory and read using a soft read process. The method further includes generating a set of joint probability values using the information from the soft read process and data indicating true bit values for the data codeword, determining an MI value using the set of joint probability values, and determining an FER estimate using the MI-FER conversion data structure.


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