The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2020
Filed:
Nov. 10, 2017
Applicant:
Amazon Technologies, Inc., Seattle, WA (US);
Inventors:
Varun Verma, Newcastle, WA (US);
Daniel Rabinovich, Seattle, WA (US);
Ankur Choudhary, Seattle, WA (US);
Alok Nath Katiyar, Lake Forest Park, WA (US);
Assignee:
Amazon Technologies, Inc., Seattle, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0653 (2013.01); G06F 3/0604 (2013.01); G06F 3/067 (2013.01); G06F 3/0608 (2013.01);
Abstract
A metrics subsystem determines the utilization of computing resources of server computer systems. The metrics subsystem may obtain metadata associated with a plurality of computing resources used to provide a service. The metrics subsystem determines a set of references to data included in the metadata and aggregates references of the set of references to determine utilization of computing resources and provides the utilization to a metering service.