The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2020
Filed:
Oct. 11, 2016
The Regents of the University of Colorado, a Body Corporate, Denver, CO (US);
Carol J. Cogswell, Boulder, CO (US);
Robert H. Cormack, Erie, CO (US);
The Regents of the University of Colorado, a body, Denver, CO (US);
Abstract
Scanned illumination allows for capturing 3-dimensional information about an object. A conventional reflection (or transmission) bright field (or fluorescence, darkfield, polarizing, phase contrast or interference) microscope is configured to use laterally scanned illumination (for example by moving an array in front of the light source) to scan an extended object. A pixelated detector may capture a series of images at the exit pupil of a microscope objective, and this series of images may be processed to form a Light Field image of the object. Or, a microscope is configured to provide scanned illumination to an extended object, while applying extended depth of field and 3D depth localization encoding to the resulting set of images. Thus multiple encoded images are generated. These images are decoded and combined, with custom digital signal processing algorithms, to form a 3D volume rendering or animation. Each point in the specimen is illuminated separately from its neighbors, and records its distinct PSF signature without any ambiguity arising from adjacent points on the object.