The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2020

Filed:

Oct. 28, 2016
Applicant:

Siemens Healthcare Gmbh, Erlangen, DE;

Inventors:

Himanshu Bhat, Newton, MA (US);

Uvo Hoelscher, Erlangen, DE;

Mario Zeller, Erlangen, DE;

Assignee:

Siemens Healthcare GmbH, Erlangen, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/483 (2006.01); G01R 33/561 (2006.01); G01R 33/563 (2006.01); G01R 33/565 (2006.01);
U.S. Cl.
CPC ...
G01R 33/4835 (2013.01); G01R 33/5611 (2013.01); G01R 33/56341 (2013.01); G01R 33/56581 (2013.01);
Abstract

In a method and apparatus for acquiring magnetic resonance (MR) data, MR signals are acquired simultaneously from S slices, of a total of N slices of a subject, with S being an SMS factor. The N slices are respectively at different positions from an isocenter of the data acquisition scanner, thereby causing said MR signals to be affected differently by Maxwell terms of magnetic fields that give said MR signals respective signal dephasings that are dependent on the distance of a respective slice from the isocenter. The SMS MR data acquisition sequence is executed with a spacing between each pair of adjacent slices being less than N/S. Maxwell correction gradient moments are calculated at an average position between the S slices, thereby generating corrected k-space data wherein the signal dephasing of the MR signals from the S slices is reduced.


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