The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2020

Filed:

Apr. 06, 2018
Applicants:

Siemens Healthcare Gmbh, Erlangen, DE;

Duke University, Durham, NC (US);

Inventors:

Stephan Kannengiesser, Wuppertal, DE;

Berthold Kiefer, Erlangen, DE;

Mustafa R. Bashir, Cary, NC (US);

Claudia Fellner, Lappersdorf, DE;

Marcel Dominik Nickel, Herzogenaurach, DE;

Assignees:

Siemens Healthcare GmbH, Erlangen, DE;

Duke University, Durham, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/48 (2006.01); G01R 33/56 (2006.01); G01R 33/565 (2006.01); A61B 5/055 (2006.01); G01R 33/50 (2006.01); A61B 5/00 (2006.01); G01R 33/561 (2006.01);
U.S. Cl.
CPC ...
G01R 33/4828 (2013.01); A61B 5/055 (2013.01); A61B 5/4244 (2013.01); A61B 5/4872 (2013.01); G01R 33/50 (2013.01); G01R 33/5602 (2013.01); G01R 33/565 (2013.01); G01R 33/5608 (2013.01); G01R 33/5613 (2013.01);
Abstract

In a magnetic resonance (MR) apparatus and a method for operating such an apparatus, a T1 parameter map is generated with fat fraction correction, by using a model in which the fat fraction of acquired MR data is used as a known parameter. The T1 values from the acquired MR data are fat fraction-corrected in such a manner, so as to generate fat fraction-corrected entries for the T1 parameter map according to the model.


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