The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2020
Filed:
Feb. 22, 2017
International Business Machines Corporation, Armonk, NY (US);
Mary P. Kusko, Hopewell Junction, NY (US);
Franco Motika, Hopewell Junction, NY (US);
Gerard M. Salem, Essex Junction, VT (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
Providing non-destructive recirculation test support in a device under test includes determining an initial latch allocation of a plurality of latches to form a plurality of self-test chains for the device under test. An optimized latch allocation to the self-test chains is determined based on a plurality of physical and logical grouping constraints. One or more of the latches are adjusted and reassigned between one or more of the self-test chains based on the optimized latch allocation. A recirculating feedback is coupled from an output of at least one of the self-test chains to a recirculation selector. A test input source is coupled to the recirculation selector, where the recirculation selector is operable to select between providing the test input source or the recirculating feedback to an input of the at least one of the self-test chains.