The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2020

Filed:

Feb. 22, 2017
Applicant:

University of Notre Dame Du Lac, South Bend, IN (US);

Inventors:

Gyorgy Csaba, South Bend, IN (US);

Adam Papp, South Bend, IN (US);

Jonathan Chisum, South Bend, IN (US);

Wolfgang Porod, South Bend, IN (US);

Gary Bernstein, South Bend, IN (US);

Assignee:

University of Notre Dame du Lac, South Bend, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/12 (2006.01); G01R 23/16 (2006.01);
U.S. Cl.
CPC ...
G01R 23/16 (2013.01); G01R 33/1284 (2013.01);
Abstract

An example device includes a magnetic film, two or more spin wave generators, and one or more detectors. The magnetic film is capable of supporting spin waves. The two or more spin wave generators are operable to create a diffraction pattern of the spin waves in the magnetic film. The two or more spin wave generators generate the spin waves based on a source signal. The one or more detectors are operable to measure an amplitude of the spin waves in the diffraction pattern. The amplitude measured by a particular detector is indicative of a property of the source signal.


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