The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2020
Filed:
Sep. 06, 2016
Furukawa Electric Co., Ltd., Tokyo, JP;
Kenichi Kimura, Tokyo, JP;
Jie Xu, Tokyo, JP;
Ken Tsukii, Tokyo, JP;
Toru Takahashi, Tokyo, JP;
Mariko Matsunaga, Tokyo, JP;
Furukawa Electric Co., Ltd., Tokyo, JP;
Abstract
A screening apparatus for searching for a predetermined microparticle based on optical information emitted from microparticles to selectively pick up the microparticle searched for includes a measurement chip that is made of a light permeable material, the measurement chip having a well formed therein that retains a liquid including at least one microparticle, a measuring section that is configured to acquire optical information emitted by the microparticles retained in the measurement chip, an analyzing section that is configured to analyze the optical information to extract optical information associated with the microparticles retained in the well, a liquid retaining section provided on the measurement chip, a draining section that is configured to drain a liquid retained in the liquid retaining section, an introducing section that introduces a liquid into the liquid retained section, and a liquid level controlling section that controls a liquid level of the liquid retaining section.