The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2020
Filed:
Oct. 15, 2015
Shimadzu Corporation, Kyoto-shi, Kyoto, JP;
Yoshitake Yamamoto, Kyoto, JP;
Hideki Yamamoto, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto-shi, Kyoto, JP;
Abstract
A signal intensity based on a total ion current signal or the like is calculated from mass spectra obtained by a normal mode of mass spectrometric analysis. When the signal intensity has exceeded an intensity threshold, the beginning time Tof a chromatogram peak is estimated from that signal intensity as well as one or more previous signal intensities. An MSexecution permission-beginning time Ts is calculated by adding, to the beginning time T, a delay time Tdelay determined front a half-value width of the peak estimated according to an LC separation condition. At or after the point in time where the actual time passes Ts, a peak which satisfies a precursor-ion selection condition is selected on a mass spectrum obtained by the mass spectrometric analysis. Then, an MSanalysis with the m/z of the selected peak as the target is immediately performed to obtain an MSspectrum. By appropriately determining the delay time Tdelay, a high-sensitivity MSspectrum for a target component can be obtained when the concentration of the target component has become sufficiently high, and the accuracy of a qualitative determination or structural analysis of the component is thereby improved.