The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2020
Filed:
Mar. 09, 2017
Kabushiki Kaisha Toshiba, Tokyo, JP;
Kyoto University, Kyoto, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Kyoto University, Kyoto, JP;
Abstract
According to an embodiment, a structure evaluation system includes a plurality of AE sensors, a signal processor, a position locator, and an evaluator. The AE sensors detect an elastic wave generated from a structure. The signal processor performs signal processing on the elastic wave detected by the AE sensors and outputs an AE signal including information on the elastic wave. The position locator derives a source distribution indicating the distribution of sources of the elastic wave generated in the structure, using an AE signal caused by an impact on the structure. The evaluator evaluates a state of deterioration of a predetermined region of the structure from a density of the sources of the elastic wave obtained on the basis of the source distribution.