The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2020

Filed:

Jan. 17, 2018
Applicants:

Paul Atkinson, Poway, CA (US);

John Rilum, Tustin, CA (US);

Edzer Huitema, Belmont, CA (US);

Inventors:

Paul Atkinson, Poway, CA (US);

John Rilum, Tustin, CA (US);

Edzer Huitema, Belmont, CA (US);

Assignee:

Chromera, Inc., Poway, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G08B 13/19 (2006.01); G01N 21/88 (2006.01); G08B 21/18 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8806 (2013.01); G08B 21/18 (2013.01); G01N 2021/8835 (2013.01);
Abstract

In one embodiment, an optical state monitor includes an a light source detection layer for detecting electromagnetic radiation from an associated good. The optical state monitor uses a processor to evaluate the detected radiation, and make a comparison to a pre-defined optical state profile for the good. By making this comparison, the optical state detector is able to determine a quality for the good. In a particular construction, the optical state detector has an integral light source, and the light detection layer is printed as s thin film device. In this way, a stand-alone self-contained sensor is constructed for determining the good's current quality.


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