The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2020
Filed:
Dec. 06, 2017
Flir Systems Ab, Täby, SE;
Jonas Sandsten, Lomma, SE;
Joakim Sjunnebo, Cambridge, GB;
FLIR SYSTEMS AB, Täby, SE;
Abstract
Systems and methods disclosed herein provide for gas imaging. A gas imaging system comprises a lenslet array configured to receive thermal radiation from a scene and transmit a plurality of substantially identical sub-images of the thermal radiation; a birefringent polarization interferometer configured to generate an optical path difference for each ray of the plurality of sub-images based on a respective position of each ray entering the BPI, the optical path differences combining to form an interference fringe pattern; and an infrared focal plane array configured to capture a thermal image of the plurality of sub-images modulated by the interference fringe pattern due to the optical path differences through the BPI. The captured thermal image may represent a plurality of interferogram sample points of the thermal radiation from the scene, and may be used to construct a plurality of hyperspectral images of the thermal radiation from the scene.