The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2020
Filed:
Jun. 13, 2019
Werth Messtechnik Gmbh, Giessen, DE;
Ralf Christoph, Giessen, DE;
Ingomar Schmidt, Erfurt, DE;
Benjamin Hopp, Giessen, DE;
Sebastian Zoeller, Weilmuenster-Laubuseschbach, DE;
Markus Hechler, Wetzlar-Garbenheim, DE;
Stefan Gruenwald, Giessen, DE;
Andreas Ettemeyer, Grabs, CH;
Sabine Linz-Dittrich, Gamprin-Bendern, LI;
Matthias Andraes, Florstadt, DE;
WERTH MESSETECHNIK GMBH, Giessen, DE;
Abstract
The invention relates to a device and a method for tactile/optical measuring of geometric features and structures on a workpiece. In order to be able to precisely align the probe extension for performing precise measurements without problems, a probe is proposed comprising a probe extension () having a flexurally elastic design at least in segments and having a mounting segment for mounting in a receptacle () comprising a mounting segment () implemented as a rotational lock.