The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2020
Filed:
Oct. 20, 2015
Applicant:
Victor B. Kley, Berkeley, CA (US);
Inventor:
Victor B. Kley, Berkeley, CA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B24B 37/11 (2012.01); G01Q 30/04 (2010.01); G01Q 80/00 (2010.01);
U.S. Cl.
CPC ...
B24B 37/11 (2013.01); G01Q 30/04 (2013.01); G01Q 80/00 (2013.01);
Abstract
A lapping system for lapping portions of a workpiece. The lapping system includes, a lap that is defined by a surface. Portions of the surface are a lapping surface. The lapping surface has a coating that enhances material removal from a workpiece in a lapping process. The lapping system further includes, a scanning probe microscope having a tip and a substrate. The scanning probe microscope controls lapping motion of the lap and workpiece.
Kley, Victor. (2020). Method and apparatus for nanolapping (U.S. Patent No. 10610995). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10610995
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile