The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2020

Filed:

Jun. 29, 2018
Applicant:

Semiconductor Components Industries, Llc, Phoenix, AZ (US);

Inventors:

Marko Mlinar, Horjul, SI;

Ulrich Boettiger, Garden City, ID (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/33 (2006.01); H04N 13/271 (2018.01); H04N 9/04 (2006.01); G06T 7/521 (2017.01);
U.S. Cl.
CPC ...
H04N 13/271 (2018.05); G06T 7/521 (2017.01); H04N 5/332 (2013.01); H04N 9/04553 (2018.08); G06T 2207/10048 (2013.01);
Abstract

An imaging system may include an image sensor, a lens, and layers with reflective properties, such as an infrared cut-off filter, between the lens and the image sensor. The lens may focus light from an object in a scene onto the image sensor. Some of the light directed onto the image sensor may form a first image on the image sensor. Other portions of the light directed onto the image sensor may reflect off of the image sensor and back towards the layers with reflective properties. These layers may reflect the light back onto the image sensor, forming a second image that is shifted relative to the first image. Depth mapping circuitry may compare the first and second images to determine the distance between the imaging system and the object in the scene.


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