The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2020

Filed:

Jan. 22, 2019
Applicant:

Black Sesame International Holding Limited, Santa Clara, CA (US);

Inventors:

Chao Wang, Shanghai, CN;

Fangwei Cai, Shanghai, CN;

Donghui Wu, San Mateo, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/235 (2006.01); H04N 5/247 (2006.01);
U.S. Cl.
CPC ...
H04N 5/2355 (2013.01); H04N 5/2351 (2013.01); H04N 5/247 (2013.01);
Abstract

A method of measuring lighting condition using dual cameras, having capturing a reference image, estimating a first minimum exposure target value, capturing a first plurality of minimum exposure value images, determining a first overall minimum exposure value, estimating a first maximum exposure target value, capturing a first plurality of maximum exposure value images, determining a first overall maximum exposure value of the first plurality of associated maximum exposure values and estimating a first dynamic exposure range as encompassing a first range having the first overall minimum exposure value as a first lower bound and the first overall maximum exposure value as a first upper bound.


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Wang, Chao. (2020). Method of measuring light using dual cameras (U.S. Patent No. 10609299). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10609299

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