The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2020

Filed:

Dec. 06, 2018
Applicant:

Analog Devices, Inc., Norwood, MA (US);

Inventors:

Hongxing Li, Andover, MA (US);

Jesper Steensgaard-Madsen, Sequim, WA (US);

Assignee:

Analog Devices, Inc., Norwood, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/38 (2006.01); H03M 1/10 (2006.01); H03M 1/06 (2006.01); H03M 1/14 (2006.01);
U.S. Cl.
CPC ...
H03M 1/1057 (2013.01); H03M 1/1009 (2013.01); H03M 1/069 (2013.01); H03M 1/145 (2013.01);
Abstract

Various background calibration techniques to calibrate inter-stage gain, e.g., in pipelined ADCs, are described to allow open loop amplifier circuits to be used as residue amplifiers for better power efficiency. Using various techniques, a well-controlled perturbation can be injected between two conversions and the actual perturbation after a residue amplifier can be measured. By comparing the actual measurement against an expected value, the gain information of the residue amplifier can be estimated and then calibration can be applied.


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