The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2020
Filed:
Apr. 12, 2018
Applicant:
Palo Alto Research Center Incorporated, Palo Alto, CA (US);
Inventors:
Robert A. Street, Palo Alto, CA (US);
Julie A. Bert, East Palo Alto, CA (US);
John C. Knights, Soquel, CA (US);
Assignee:
PALO ALTO RESEARCH CENTER INCORPORATED, Palo Alto, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/146 (2006.01); H01L 27/12 (2006.01); H01L 31/0224 (2006.01); G01T 7/00 (2006.01); H01L 31/18 (2006.01); H01L 31/0376 (2006.01); G01T 1/20 (2006.01);
U.S. Cl.
CPC ...
H01L 27/14663 (2013.01); G01T 1/2018 (2013.01); G01T 7/00 (2013.01); H01L 27/1218 (2013.01); H01L 27/1222 (2013.01); H01L 27/1266 (2013.01); H01L 27/14612 (2013.01); H01L 27/14623 (2013.01); H01L 27/14689 (2013.01); H01L 31/022466 (2013.01); H01L 31/03762 (2013.01); H01L 31/1892 (2013.01);
Abstract
Transitioning conventional x-ray detector materials and structures to bendable or flexible (e.g., plastic) substrates makes them rugged against breakage when dropped but exposes the detectors to damage if bent. Disclosed are bendable digital x-ray detector structures that are rugged with regard to bending as well as dropping. The structures provide strain matching between layers so that a detector backplane is in and/or near the mechanical neutral plane and therefore less susceptible to bending stress.