The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2020

Filed:

May. 15, 2017
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventor:

Wataru Shiraishi, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/67 (2006.01); G05B 19/418 (2006.01); G05B 13/02 (2006.01); G05B 23/02 (2006.01); G06Q 10/06 (2012.01); H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
H01L 21/67155 (2013.01); G05B 13/026 (2013.01); G05B 19/4184 (2013.01); G05B 23/02 (2013.01); G06Q 10/06 (2013.01); H01L 21/02 (2013.01); G05B 23/0237 (2013.01); Y02P 90/02 (2015.11); Y02P 90/14 (2015.11); Y02P 90/86 (2015.11);
Abstract

A manufacturing cell includes an allowable range setting unit configured to set an allowable range for physical quantity data or statistical processing data, and data output unit configured to output, in a case where the physical quantity data or the statistical processing data deviates from the allowable range, output information. The manufacturing cell further includes an abnormality information determination unit configured to compare the physical quantity data or the statistical processing data of a manufacturing cell as an abnormality source, with the retained physical quantity data or the retained statistical processing data of the manufacturing cell, to determine whether or not the abnormality is inherent to the manufacturing cell as the abnormality source, and a determination result notification unit for notifying a determination result.


Find Patent Forward Citations

Shiraishi, Wataru. (2020). Manufacturing cell and manufacturing cell management system (U.S. Patent No. 10607868). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10607868

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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