The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2020

Filed:

Apr. 03, 2018
Applicant:

Tsinghua University, Beijing, CN;

Inventors:

Qionghai Dai, Beijing, CN;

Mingjie Zhang, Beijing, CN;

Jiamin Wu, Beijing, CN;

Assignee:

TSINGHUA UNIVERSITY, Beijing, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/00 (2011.01); G02B 21/36 (2006.01); G02B 21/06 (2006.01); G02B 21/14 (2006.01);
U.S. Cl.
CPC ...
G06T 15/00 (2013.01); G02B 21/06 (2013.01); G02B 21/14 (2013.01); G02B 21/365 (2013.01);
Abstract

Microscopic imaging system and method with three-dimensional refractive index tomography are provided. The microscopic imaging system includes: an illumination providing module, configured to provide a beam of parallel lights with a modulated intensity; a microscopic sample, arranged at downstream of the illumination providing module, and configured to modulate a phase of the beam of parallel lights, such that emergent lights passing through the microscopic sample carry information of a three-dimensional refractive index field of the microscopic sample; a microscopic imaging module, arranged at downstream of the microscopic sample, and configured to form an image by using the emergent lights; and a controlling module, configured to process the image to reconstruct three-dimensional refractive index information of the microscopic sample.


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