The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2020
Filed:
Nov. 23, 2015
International Business Machines Corporation, Armonk, NY (US);
Youngdeok Hwang, Yorktown Heights, NY (US);
Jayant R. Kalagnanam, Tarrytown, NY (US);
Xiao Liu, Singapore, SG;
Kyong Min Yeo, Scarsdale, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Methods, systems, and computer program products for detection of an arbitrarily-shaped source of an abnormal event via use of a hierarchical reconstruction method are provided herein. A computer-implemented method includes detecting an abnormal event based on analysis of sensor data, wherein said analysis of the sensor data comprises comparing the sensor data to a user-defined threshold; generating a query based on the detected abnormal event; processing the query against one or more given data repositories; executing an inverse model using an output generated in relation to said processing to identify a source of the detected abnormal event, wherein the source comprises an arbitrary shape; and outputting the identified source of the detected abnormal event.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile