The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2020
Filed:
Apr. 04, 2017
Soreq Nuclear Research Center, Yavne, IL;
Security Matters Ltd., D.N. Hevel Eilot, IL;
Yair Grof, Rehovot, IL;
Tzemah Kislev, Mazkeret Bathya, IL;
Nadav Yoran, Tel Aviv, IL;
Haggai Alon, Kibbutz Naan, IL;
SOREQ NUCLEAR RESEARCH CENTER, Yavne, IL;
SECURITY MATTERS LTD., D.N. Hevel Eilot, IL;
Abstract
Methods and systems for verifying compatibility of components of an electronic system are disclosed. The method includes irradiating a first and second components presumably associated with the electronic system, with XRF exciting radiation, and in response thereto, detecting one or more XRF response signals indicative of first and second XRF signatures, emitted from the first and second components. Then the first and second XRF signatures are processed to determine whether they are associated with respectively a first and second XRF marking compositions on the first and second components, and the compatibility of the first and second components to the electronic system is determined/verified based on the correspondence between the first and a second XRF signatures. Electronic systems are also disclosed including at least a first and a second electronic components respectively having the first and second XRF marking compositions that enable verification of compatibility of the components.