The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2020

Filed:

Nov. 29, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Erez Barak, Hod Hasharon, IL;

Shlomit Koyfman, Armonim, IL;

Shiri Moran, Kiryat Tivon, IL;

Ido Rozenberg, Rishon le-Zion, IL;

Osher Yifrach, Modin, IL;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06F 11/34 (2006.01); G01R 31/3183 (2006.01); G06F 13/24 (2006.01);
U.S. Cl.
CPC ...
G06F 17/504 (2013.01); G01R 31/31835 (2013.01); G06F 11/3466 (2013.01); G06F 17/5022 (2013.01); G06F 13/24 (2013.01); G06F 2201/86 (2013.01);
Abstract

Examples of techniques for modifying testing tools are described herein. An example computer-implemented method includes receiving, via a processor, a netlist comprising a complex coverage event that depends on a singular independent signal. The method includes detecting, via the processor, that complex coverage event can be separated into the singular independent signal and a logic state based on a structural logic analysis. The method also includes modifying, via the processor, a testing tool to test the netlist based on the singular independent signal.


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