The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2020

Filed:

Aug. 18, 2014
Applicant:

Keysight Technologies Singapore (Sales) Pte. Ltd., Singapore, SG;

Inventors:

Deepesh Arora, Thousand Oaks, CA (US);

Kirit Bhamre, Thousand Oaks, CA (US);

Noah Gintis, Westlake Village, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3428 (2013.01); G06F 11/3419 (2013.01); G06F 11/3414 (2013.01);
Abstract

Methods, systems, and computer readable media for benchmark reference testing of data center or network equipment are disclosed. One method includes, using a network or data center test device, executing a plurality of performance tests to test a plurality of different performance parameters of a network or data center device under test. The method further includes obtaining individual test results for each of the different performance parameters. The method further includes generating a multi-dimensional score that combines the individual test results from the different performance parameters to indicate a composite performance of the data center or network device. The method further includes outputting the multi-dimensional score to a user.


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