The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2020

Filed:

Nov. 20, 2017
Applicant:

Prophetstor Data Services, Inc., Taichung, TW;

Inventors:

Wen Shyen Chen, Taichung, TW;

Wen-Chieh Hsieh, New Taipei, TW;

Chong Xuan Hong, Taichung, TW;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G06F 11/22 (2006.01); G06F 3/06 (2006.01); G06N 20/00 (2019.01); G06F 11/34 (2006.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2257 (2013.01); G06F 3/067 (2013.01); G06F 3/0616 (2013.01); G06F 3/0653 (2013.01); G06F 11/3034 (2013.01); G06F 11/3447 (2013.01); G06N 20/00 (2019.01); G06F 11/3003 (2013.01); G06F 11/3055 (2013.01); G06F 11/3058 (2013.01); G06N 3/084 (2013.01);
Abstract

A method and a system for diagnosing remaining lifetime of storages in a data center are disclosed. The method includes the steps of: a) sequentially and periodically collecting operating attributes of failed storages along with time-to-fail records of the failed storages in a data center; b) grouping the operating attributes collected at the same time or fallen in a continuous period of time so that each group has the same number of operating attributes; c) sequentially marking a time tag for the groups of operating attributes; d) generating a trend model of remaining lifetime of the storages from the operating attributes and time-to-fail records by ML and/or DL algorithm(s) with the groups of operating attributes and time-to-fail records fed according to the order of the time tags; and e) inputting a set of operating attributes of a currently operating storage into the trend model to calculate a remaining lifetime therefor.


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