The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2020

Filed:

Feb. 12, 2018
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Eiji Yamamoto, Kyoto, JP;

Masahiko Nakano, Ritto, JP;

Junji Shimamura, Takatsuki, JP;

Assignee:

OMRON Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01); G05B 19/05 (2006.01);
U.S. Cl.
CPC ...
G05B 19/41835 (2013.01); G05B 19/056 (2013.01); G05B 2219/1105 (2013.01); G05B 2219/1134 (2013.01); G05B 2219/13152 (2013.01); G05B 2219/34288 (2013.01);
Abstract

In a control device which can execute a first program entirely scanned in each control cycle to update a command value, and a sequentially interpreted second program, an environment for realizing higher control performance is provided. The control device includes a first program execution part scanning the entire first program in each control cycle to update a command value and a second program execution part updating the command value in each control cycle according to a sequentially interpreted second program. The second program execution part includes an interpreter generating an intermediate code and a command value operation part calculating the command value in each control cycle according to the intermediate code. The command value operation part outputs the command value in each control cycle so that the command value can be used in other processes.


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