The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2020

Filed:

Nov. 27, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

David J. Gifford, Germantown, NY (US);

Feng Xue, Singapore, SG;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01); G06Q 10/06 (2012.01); G06Q 10/08 (2012.01);
U.S. Cl.
CPC ...
G05B 19/4183 (2013.01); G05B 19/41805 (2013.01); G05B 19/41865 (2013.01); G06Q 10/06312 (2013.01); G06Q 10/0875 (2013.01); G05B 2219/31036 (2013.01);
Abstract

A method includes receiving a training data set for a first plurality of assemblies, wherein the training data set includes a plurality of components for each of two or more types of components of the first plurality of assemblies. The method analyzes the training data set for the first plurality of assemblies. Responsive to receiving a set of product component information for a second plurality of assemblies, the method creates a graded product cluster template for the second plurality of assemblies based on the analyzed training data for the first plurality of assemblies. The method sends the graded product cluster template to an automated manufacturing device, wherein the automated manufacturing device manufactures a first assembly from the second plurality of assemblies based on the graded product cluster template.


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