The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2020

Filed:

Oct. 11, 2017
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventor:

Kenichi Ogawa, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/18 (2006.01); G06N 20/00 (2019.01); G06N 3/08 (2006.01); B23Q 15/12 (2006.01); B23Q 15/18 (2006.01);
U.S. Cl.
CPC ...
G05B 19/18 (2013.01); B23Q 15/12 (2013.01); B23Q 15/18 (2013.01); G06N 3/08 (2013.01); G06N 20/00 (2019.01);
Abstract

A machine learning apparatus learns a setting value in a machining program of a machine tool configured to machine an impeller. The machine learning apparatus includes a state observation unit configured to acquire the thermal displacement amount during a period of machining a workpiece, as a state variable, and a determination data acquisition unit configured to receive the imbalance amount in the impeller after machining as determination data. The machine learning apparatus includes a learning unit configured to learn the setting value in the machining program on the basis of output from the state observation unit and output from the determination data acquisition unit.


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Ogawa, Kenichi. (2020). Machine learning apparatus that learns setting value in machining program of machine tool, and machining system (U.S. Patent No. 10606233). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10606233

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