The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2020
Filed:
May. 23, 2018
Method and apparatus for measuring and evaluating spatial resolution of hologram reconstructed image
Electronics and Telecommunications Research Institute, Daejeon, KR;
Jeho Nam, Daejeon, KR;
Jin Woong Kim, Daejeon, KR;
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE, Daejeon, KR;
Abstract
An apparatus for measuring a spatial resolution of a hologram reconstructed image optically reconstructed on a space is provided. The apparatus for measuring a spatial resolution of a hologram reconstructed image includes: a measuring unit measuring first spatial frequency resolving powers for a horizontal direction of the hologram reconstructed image and second spatial frequency resolving powers for a vertical direction of the hologram reconstructed image at first spatial positions having a predetermined interval in horizontal and vertical directions within a viewing angle range of the hologram reconstructed image; and an evaluating unit evaluating the spatial resolution of the hologram reconstructed image using the first spatial frequency resolving powers and the second spatial frequency resolving powers measured at each of the first spatial positions.