The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2020

Filed:

Dec. 21, 2015
Applicant:

Nlt Technologies, Ltd., Kawasaki, Kanagawa, JP;

Inventors:

Takuya Asai, Kanagawa, JP;

Koji Shigemura, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02F 1/1343 (2006.01); G02F 1/1335 (2006.01); G02B 27/22 (2018.01);
U.S. Cl.
CPC ...
G02B 27/2214 (2013.01); H04N 2213/001 (2013.01);
Abstract

To provide a naked-eye type stereoscopic display device which can achieve a fine stereoscopic display property while achieving high-definition display and high yield. Aperture parts of sub-pixels neighboring to a first direction include overlapping regions which overlap in a second direction and a non-overlapping region which does not overlap. Provided that a width of the aperture part in the second direction is defined as a longitudinal aperture width, the non-overlapping region includes an aperture width fluctuating region where the longitudinal aperture width changes continuously from roughly a center of the aperture part towards both ends of the first direction, respectively. The sum of the longitudinal aperture widths of the two overlapping regions overlapping with each other at a same position in the first direction is larger than the longitudinal aperture width in roughly the center of the aperture part.


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