The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2020
Filed:
Mar. 17, 2017
Hitachi, Ltd., Tokyo, JP;
Toru Shirai, Tokyo, JP;
Ryota Satoh, Tokyo, JP;
Yo Taniguchi, Tokyo, JP;
Hisaaki Ochi, Tokyo, JP;
Takenori Murase, Tokyo, JP;
Yoshitaka Bito, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
In calculating a local magnetic field distribution caused by a magnetic susceptibility difference between living tissues, using MRI, a local frequency distribution with a high SNR is calculated in a short computation time. Multi-echo complex images obtained by measurement of at least two different echo times using the MRI are converted into low-resolution images. A global frequency distribution caused by global magnetic field changes and an offset phase distribution including a reception phase and a transmission phase are separated from a phase distribution of the low-resolution multi-echo complex images. Thus calculated global frequency distribution and the offset phase distribution are enhanced in resolution. A local frequency distribution of each echo is calculated from the measured multi-echo complex images, the high-resolution global frequency distribution, and the high-resolution offset phase distribution. The local frequency distributions of respective echoes are subjected to weighted averaging, whereby a final local frequency distribution is calculated.