The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2020

Filed:

Feb. 22, 2018
Applicant:

Denso Corporation, Kariya, Aichi-pref., JP;

Inventors:

Kotaro Nakashima, Kariya, JP;

Takashi Suzuki, Kariya, JP;

Masaya Taki, Kariya, JP;

Yohei Kaneda, Kariya, JP;

Assignee:

DENSO CORPORATION, Kariya, Aichi-pref., JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 19/03 (2006.01); G01R 19/00 (2006.01); G01R 31/327 (2006.01); G01R 31/00 (2006.01); G01R 31/40 (2020.01);
U.S. Cl.
CPC ...
G01R 19/003 (2013.01); G01R 31/3278 (2013.01); G01R 31/006 (2013.01); G01R 31/40 (2013.01);
Abstract

An abnormality diagnosis apparatus performs: a first step of diagnosing a shortage of precharge voltage or a short-circuit failure between electrodes of a capacitor based on a detection value of a precharge voltage detection circuit in a state where a first relay and a second relay are turned off, and a precharge circuit is operated; a second step of diagnosing, after a normal determination in the first step, a disconnection failure of a precharge path based on the detection value of the precharge voltage detection circuit or a detection value of an inter-relay voltage detection circuit in a state where the first relay and the second relay are turned off, and the precharge circuit is not operated; and a relay failure diagnosis step of diagnosing, after a normal determination in the second step, a short-circuit failure and an open failure of the first relay or the second relay.


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