The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2020
Filed:
Apr. 28, 2017
Ut-battelle, Llc, Oak Ridge, TN (US);
Joseph M. Lukens, Knoxville, TN (US);
Nicholas A. Peters, Knoxville, TN (US);
Raphael C. Pooser, Knoxville, TN (US);
UT-Battelle, LLC, Oak Ridge, TN (US);
Abstract
Nonlinear interferometers include a nonlinear optical medium that is situated to produce a conjugate optical beam in response to a pump beam and a probe beam. The pump, probe, and conjugate beams propagate displaced from each other along a common optical path. One of the beams is selectively phase shifted, and the beams are then returned to the nonlinear medium, with the selectively phase shift beam phase shifted again. The nonlinear medium provides phase sensitive gain to at least one of the probe or conjugate beams, and the amplified beam is detected to provide an estimate of the phase shift.