The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2020

Filed:

May. 23, 2016
Applicant:

Yokogawa Electric Corporation, Musashino-shi, Tokyo, JP;

Inventors:

Shigeru Takezawa, Tokyo, JP;

Takuya Yahagi, Tokyo, JP;

Yoshihisa Hidaka, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/3504 (2014.01); G01N 21/85 (2006.01); G01N 33/00 (2006.01); G01N 9/36 (2006.01); F23K 5/00 (2006.01); G01N 33/22 (2006.01);
U.S. Cl.
CPC ...
G01N 21/3504 (2013.01); G01N 9/36 (2013.01); G01N 21/85 (2013.01); G01N 33/0032 (2013.01); F23K 5/002 (2013.01); G01N 33/0036 (2013.01); G01N 33/0062 (2013.01); G01N 33/225 (2013.01); G01N 2033/0068 (2013.01); G01N 2201/12 (2013.01);
Abstract

A multi-component gas analysis system includes a spectrometric analysis device configured to obtain ratio of each of first components in a multi-component gas based on an absorption spectrum of light that has transmitted through the multi-component gas; a density measurement device configured to measure a first density of the multi-component gas; and a calculation device configured to calculate a ratio of each of second components in the multi-component gas using the ratio of each of the first components obtained by the spectrometric analysis device and the first density measured by the density measurement device, the second components being components that cannot be obtained by the spectrometric analysis device.


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