The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2020

Filed:

Oct. 05, 2015
Applicant:

Duravit Aktiengesellschaft, Hornberg, DE;

Inventors:

Bernd Spangenberg, Offenburg, DE;

Dirk Jansen, Ohlsbach, DE;

Bernd Kaiser, Endingen, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/493 (2006.01); A61B 5/20 (2006.01); G01N 15/14 (2006.01); A61B 10/00 (2006.01); G01N 21/47 (2006.01); E03D 11/02 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1459 (2013.01); A61B 5/208 (2013.01); A61B 10/007 (2013.01); G01N 15/14 (2013.01); G01N 33/493 (2013.01); E03D 11/02 (2013.01); G01N 2015/1486 (2013.01); G01N 2021/4707 (2013.01);
Abstract

An apparatus for analyzing urine, including: a feeding and discharging device that delivers a quantity of urine into an analysis chamber of a urine test strip and discharges a quantity of urine from an analysis chamber of a urine test strip, the analysis chamber having an analysis zone. The feeding and discharging device includes a movably mounted feeding and/or discharging element for delivering a quantity of urine into a delivery zone in the analysis chamber and/or discharging a quantity of urine from a discharge zone in the analysis chamber. A detection device detects an at least sectoral variation of an optically detectable parameter, which varies in an optically detectable manner in accordance with the composition of a quantity of urine that contacts the analysis zone and produces detection data describing at least one optically detected parameter in the analysis zone or a variation of such a parameter.


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