The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2020
Filed:
Jul. 18, 2016
Fraunhofer-gesellschaft Zur Foerderung Der Angewandten Forschung E.v., Munich, DE;
Abstract
The invention relates to an assembly for determining the permeation rate of a sample for at least one permeate, in particular water vapor, wherein multiple detectors are arranged in a row or in a row and column arrangement for the spatially resolved spectral analysis of electromagnetic radiation within a wavelength interval. The detectors are connected to an electronic evaluation unit and are arranged such that electromagnetic radiation emitted from a broadband radiation source is incident on the detectors either after being reflected by the surface of the sample, by a layer formed on the sample, or by the surface of a layer within the sample, and/or after passing through a sample which is transparent to the electromagnetic radiation. The irradiation is carried out such that a homogeneous intensity of the electromagnetic radiation is maintained on a surface, by means of which the electromagnetic radiation is reflected or through which the radiation is transmitted. The electronic evaluation unit is designed such that the detector measurement signals detected in a spatially- and wavelength-resolved manner can be detected within a wavelength interval for individual location points which are arranged on a specifiable surface of the sample. Each of the measurement signals detected at multiple positions are assigned to a sub-region of the detected surface (hypercube), and a data reduction process is carried out for all of the detected surface sub-region measurement signals which are detected in a wavelength-resolved manner, wherein informative features are selected and can be used together with a previously ascertained regression model, which is stored in an electronic storage device, in order to draw a conclusion regarding a corresponding permeation rate, said regression model being generated using the feature sets, which are obtained analogously, of samples with permeation rates which have been ascertained using another measurement method with a higher degree of measurement precision.