The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2020
Filed:
Feb. 19, 2019
Massachusetts Institute of Technology, Cambridge, MA (US);
Thomas H. Jeys, Lexington, MA (US);
William D. Herzog, Bedford, MA (US);
Brian G. Saar, Somerville, MA (US);
Alexander M. Stolyarov, Belmont, MA (US);
Ryan Sullenberger, Lexington, MA (US);
David Crompton, Lowell, MA (US);
Shawn Michael Redmond, Lexington, MA (US);
Massachusetts Institute of Technology, Cambridge, MA (US);
Abstract
A device, and corresponding method, can include a pump light source configured to irradiate a target specimen. The device can also include a sensor configured to observe a probe speckle pattern based on light from a probe light source reflected from the target specimen. The device further may include a correlator configured to determine a material property of the target specimen by analyzing changes in images of the probe speckle pattern as a function of the irradiation with the pump light source. Advantages of the device and method can include much higher sensitivity than existing methods; the ability to use visible probe wavelengths for uncooled, low-cost visible detectors with high spatial resolution; and the ability to obtain target material properties without detecting infrared light.