The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2020

Filed:

Jun. 30, 2015
Applicants:

Hewlett-packard Development Company, L.p., Houston, TX (US);

Jordi Sender Beleta, Barcelona, ES;

Maria Isabel Borrell Bayona, Barcelona, ES;

Inventors:

Jordi Sender Beleta, Barcelona, ES;

Maria Isabel Borrell Bayona, Barcelona, ES;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J 2/21 (2006.01); B41J 2/165 (2006.01); B41J 2/155 (2006.01); B41J 29/393 (2006.01);
U.S. Cl.
CPC ...
B41J 2/2146 (2013.01); B41J 2/155 (2013.01); B41J 2/16579 (2013.01); B41J 2/16585 (2013.01); B41J 2/2135 (2013.01); B41J 2/2139 (2013.01); B41J 2/2142 (2013.01); B41J 29/393 (2013.01);
Abstract

Certain examples described herein relate to evaluating print quality. In these examples, a check image is printed at a first print quality in accordance with test image data for at least one test image, and a reference image is printed at a second print quality with reference image data corresponding to the one or more test images modified to simulate one or more print defects. A comparison of the printed reference image and the printed check image allows evaluation of a quality level for the printed check image.


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