The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2020

Filed:

Sep. 14, 2016
Applicant:

Kabushiki Kaisha Toshiba, Minato-ku, JP;

Inventors:

Satoshi Takayama, Kawasaki, JP;

Taeko Urano, Kawasaki, JP;

Kenji Nakamura, Kawasaki, JP;

Assignee:

KABUSHIKI KAISHA TOSHIBA, Minato-ku, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/08 (2006.01); A61B 5/00 (2006.01); A61B 8/14 (2006.01); A61B 8/00 (2006.01);
U.S. Cl.
CPC ...
A61B 8/5261 (2013.01); A61B 5/0059 (2013.01); A61B 8/14 (2013.01); A61B 8/4416 (2013.01);
Abstract

According to one embodiment, an ultrasound diagnostic apparatus comprises processing circuitry. The processing circuitry sets one of wavelengths of a plurality of light sources as a reference wavelength, normalize an intensity of light having a wavelength other than the reference wavelength, which is detected by a pair of each light irradiation unit and each optical detector, with an intensity of light having the reference wavelength, calculate a first value for each pair by nonlinear enhancement correction of a normalized light intensity, calculate a second value for the each pair by nonlinear reduction correction of an intensity of light having the reference wavelength detected by the each pair, and calculate an evaluation value based on a value obtained by multiplication of the first value and the second value for the each pair.


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