The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2020

Filed:

Mar. 30, 2018
Applicant:

Nidek Co., Ltd., Gamagori, Aichi, JP;

Inventors:

Michihiro Takii, Nukata, JP;

Masaaki Hanebuchi, Nukata, JP;

Hisashi Ochi, Nukata, JP;

Assignee:

NIDEK CO., LTD., Gamagori, Aichi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/032 (2006.01);
U.S. Cl.
CPC ...
A61B 3/032 (2013.01);
Abstract

A subjective optometry apparatus includes a light projecting optical system which projects a target light flux toward an examinee's eye to project a visual target onto the examinee's eye, a calibration optical system which is disposed in an optical path from the light projecting optical system to the examinee's eye and changes optical characteristics of the target light flux, an optical member which guides the target light flux of which the optical characteristics is changed by the calibration optical system to the examinee's eye, a light deflection section being different from the calibration optical system, which includes light deflection members provided in a left and right pair and a driving section which rotationally drives the light deflection members, and deflects the target light flux by rotating the light deflection members, and a control section which controls the light deflection section based on prism information to deflect the target light flux.


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