The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2020
Filed:
Dec. 16, 2010
Gerd Beck, Wurmlingen, DE;
Andre Ehrhardt, Wumlingen, DE;
Uwe Martin, Spaichingen, DE;
Bernhard Gloeggler, Tuttlingen, DE;
Hilmar Schachenmayr, Munich, DE;
Bryan Kennedy, Santa Barbara, CA (US);
Raymond Coussa, Goleta, CA (US);
Nathan Tang, Santa Barbara, CA (US);
Gerd Beck, Wurmlingen, DE;
Andre Ehrhardt, Wumlingen, DE;
Uwe Martin, Spaichingen, DE;
Bernhard Gloeggler, Tuttlingen, DE;
Hilmar Schachenmayr, Munich, DE;
Bryan Kennedy, Santa Barbara, CA (US);
Raymond Coussa, Goleta, CA (US);
Nathan Tang, Santa Barbara, CA (US);
Karl Storz SE & Co. KG, Tuttlingen, DE;
Abstract
A method for testing an optical investigation system, with an imaging device, a video camera and a light source for optical investigation of an object including a reference surface with predetermined optical properties being illuminated with illuminating light from a light source. An image of the reference surface is recorded by the imaging device and the video camera. An operating condition of the video camera that prevails during the recording of the image is recorded. The functionality or another property of the investigation system is determined on the basis of the recorded operating condition.