The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2020
Filed:
Sep. 16, 2015
Fluke Corporation, Everett, WA (US);
Michael D. Stuart, Issaquah, WA (US);
Paul H. Heydron, Everett, WA (US);
Joseph V. Ferrante, Richmond, WA (US);
Michael A. Schoch, Granite Falls, WA (US);
Hilton G. Hammond, Bothell, WA (US);
Fluke Corporation, Everett, WA (US);
Abstract
Systems can include a test and measurement tool configured to generate measurement data, and imaging tool configured to generate image data, and a processor in communication with the imaging tool and the test and measurement tool. The processor can be configured to receive image data from the imaging tool and, if the image data satisfies one or more predetermined conditions, trigger the test and measurement tool to perform one or more corresponding operations. Similarly, the processor can receive measurement data from the test and measurement tool and, if the measurement data satisfies one or more predetermined conditions trigger the imaging tool to perform one or more corresponding operations.