The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2020

Filed:

May. 23, 2019
Applicant:

Accenture Global Solutions Limited, Dublin, IE;

Inventors:

Jagaran Das, Durgapur, IN;

Rizwan Khan, Kolkata, IN;

Biju Radhakrishnan, Kolkata, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
H04L 41/0654 (2013.01); H04L 41/069 (2013.01); H04L 41/0613 (2013.01); H04L 41/0636 (2013.01); H04L 41/16 (2013.01);
Abstract

An applied intelligence framework may receive log information descriptive of a cloud computing stack. The applied intelligence framework may generate a stack token. The stack token may include a computer resource node representative a computer resource of the cloud computing stack. The applied intelligence framework may access, from an ontology repository, a diagnosis instruction. The diagnosis instruction may determine a fault based on at least one of the log parameters. The applied intelligence framework may execute the diagnosis instruction to determine the fault. The applied intelligence framework may append, to the stack token, a fault node representative of the fault. The applied intelligence framework may query an ontology repository based on the stack token to identify a resolution identifier. The applied intelligence framework may append, to the stack token, a resolution node. The applied intelligence framework may determine, based on stack token and the applied ontology repository, a resolution to the fault.


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