The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2020

Filed:

Jul. 18, 2018
Applicant:

Robert Bosch Gmbh, Stuttgart, DE;

Inventors:

Christian Haubelt, Kritzmow, DE;

Rainer Dorsch, Kirchentellinsfurt, DE;

Sebastian Stieber, Rostock, DE;

Shengxian Liu, Shanghai, CN;

Assignee:

Robert Bosch GmbH, Stuttgart, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 7/00 (2006.01); H04Q 9/00 (2006.01); H04J 3/06 (2006.01); H04L 7/04 (2006.01); H04L 7/08 (2006.01); H04L 12/40 (2006.01);
U.S. Cl.
CPC ...
H04L 7/0012 (2013.01); H04J 3/0638 (2013.01); H04L 7/0037 (2013.01); H04L 7/042 (2013.01); H04L 7/08 (2013.01); H04Q 9/00 (2013.01); H04L 12/40 (2013.01); H04Q 2209/753 (2013.01);
Abstract

A method for synchronizing sensor data of a sensor system with the host time base of a host system, based on the clock ratio of the sensor time base to the host time base. To ascertain the clock ratio for at least two communication events, a time stamp acquisition is performed for each event, in which a sensor time stamp and a host time stamp is recorded. The communication events for ascertaining the clock ratio relate to a specific quantity of data. The ratio is ascertained/updated repeatedly; the duration of the individual communication events for the time stamp acquisition are measured; and by comparing each measured duration to a comparison value, possible irregularities in the communication event are detected. The host time stamp of a time stamp acquisition is corrected/replaced by a calculated host time stamp based on the measured irregularities. Also described is a related device for the method.


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