The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2020

Filed:

Oct. 01, 2018
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Inventors:

Zhan Zhan, Suwon-si, KR;

Ju Hyun Kim, Suwon-si, KR;

Sung Gun Kang, Suwon-si, KR;

Hwa Sung Rhee, Seongnam-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/528 (2006.01); H01L 21/66 (2006.01); H01L 27/092 (2006.01); G01R 31/28 (2006.01); H01L 29/08 (2006.01);
U.S. Cl.
CPC ...
H01L 22/34 (2013.01); G01R 31/2884 (2013.01); H01L 22/32 (2013.01); H01L 23/528 (2013.01); H01L 27/092 (2013.01); H01L 29/0847 (2013.01);
Abstract

A test element group includes a test element including a plurality of test transistors connected in series between a first node and a second node, the second node being connected to a ground node; a first transistor connected between the first node and a power supply node; and a second transistor configured to generate an output current, proportional to a voltage at the first node, and connected to the first node and the power supply node.


Find Patent Forward Citations

Zhan, Zhan. (2020). Test element group and semiconductor wafer including the same (U.S. Patent No. 10600702). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10600702

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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