The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2020

Filed:

Aug. 11, 2017
Applicant:

Thermo Fisher Scientific (Bremen) Gmbh, Bremen, DE;

Inventors:

Norbert Quaas, Bremen, DE;

Hans-Juergen Schlueter, Bremen, DE;

Gerhard Jung, Delmenhorst, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/36 (2006.01); H01J 49/40 (2006.01); H01J 49/00 (2006.01); H01J 49/42 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0009 (2013.01); H01J 49/36 (2013.01); H01J 49/40 (2013.01); H01J 49/4215 (2013.01); H01J 49/4225 (2013.01);
Abstract

A method of calibrating a mass spectrometer is disclosed. The mass spectrometer includes a first quadrupole, a second mass analyzer and a detection means. The method includes calibrating the second mass analyzer at a first time, calibrating the first quadrupole at a second time later than the first including a) determining for each of several selected masses a corresponding value of the amplitude of the RF voltage and DC voltage applied to the electrodes of the first quadrupole, b) fitting a function of the selected mass to the values of the amplitude of the RF voltage and DC voltage corresponding to the several selected masses, c) detecting the selected mass in a filter window width over a mass range, d) evaluating a shift of the peak position and/or a deviation of the filter window width, and e) repeating the calibration steps under certain conditions.


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