The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2020

Filed:

Mar. 09, 2017
Applicant:

Institute of Automation, Chinese Academy of Sciences, Beijing, CN;

Inventors:

Tieniu Tan, Beijing, CN;

Jing Dong, Beijing, CN;

Wei Wang, Beijing, CN;

Bo Peng, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); G06K 9/00 (2006.01); G06T 15/20 (2011.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 15/205 (2013.01); G06K 9/00201 (2013.01); G06K 9/00362 (2013.01); G06K 9/00671 (2013.01); G06T 7/00 (2013.01); G06T 2201/0201 (2013.01); G06T 2215/16 (2013.01);
Abstract

An image tampering forensics method includes labeling an observation clue of a to-be-detected image, constructing a three-dimensional morphable model of an object of a category to which the target object belongs, estimating a three-dimensional normal vector to the supporting plane according to the observation clue, estimating a three-dimensional attitude of the target object according to the observation clue and the three-dimensional morphable model to obtain a plane normal vector to a plane where a side of target object in contact with the supporting plane is located, computing a parallelism between the target object and the supporting plane, and/or among a plurality of target objects, and judging whether the to-be-detected image is a tampered image or not according to the parallelism.


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