The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2020
Filed:
Oct. 22, 2018
Applicant:
Omron Corporation, Kyoto-shi, Kyoto, JP;
Inventors:
Xingdou Fu, Kizugawa, JP;
Masaki Suwa, Kyoto, JP;
Assignee:
OMRON Corporation, Kyoto-shi, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/521 (2017.01); G06T 7/73 (2017.01); G06T 7/593 (2017.01); G01B 11/25 (2006.01);
U.S. Cl.
CPC ...
G06T 7/521 (2017.01); G01B 11/2513 (2013.01); G01B 11/2545 (2013.01); G06T 7/593 (2017.01); G06T 7/74 (2017.01);
Abstract
Three-dimensional measurement is performed by projecting patterned light having a hybrid pattern Ph onto a measurement target. The hybrid pattern Ph is a pattern in which a random pattern Pr is superimposed on a structured light pattern Ps, and is arranged in pattern such that the random pattern Pr and the structured light pattern Ps do not interfere mutually.